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kSA Multi-beam Optical Sensor (MOS)

 

Real time strain analysis for ultimate thin film process control..

Click here to go to a press release on the KSA Multi-beam Optical Sensor.

The kSA Multi-beam Optical Sensor (MOS) is an extremely sensitive laser based system for in situ, real-time monitoring of thin film strain. The strain measurement is performed by monitoring the substrate curvature with an array of parallel laser beams and a CCD area detector. Since the technique is optically based it is compatible with CVD, sputtering and MBE environments, provided that optical access is available to the substrate. The system is ideally suited for real-time feedback to process control systems in the production or research environment.

You can read further about the MOS system in our article "A Laser Based Thin-Film Growth Monitor" in the March '98 issue of The Industrial Physicist on page 25.

· The MOS system is extremely robust – simultaneous detection of the laser spot array makes the measurement virtually immune to vibration.

· Flexible design allows mounting in either a single port (normal incidence) or 2-port configuration.

· Integrated Windows 95/NT software provides real-time analysis and display of film strain, substrate curvature, stress-thickness product or mean differential spot spacing.

· Measurement can be performed with substrate rotation using fully supported external triggering functions.

· Optimized optics and detection system combined with proven fitting algorithms result in radius of curvature detection exceeding 10 kilometers.

· 2-dimensional laser array can provide surface curvature and strain topography mapping.

· Can be used for real-time compositional profiling and elastic constant determination.

 

Click here to see available MOS 2D arraying screen information at full size (1024x768)

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Copyright © 2001 Moorfield Associates
Last modified: January 12, 2007
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